Transformation invariance in pattern recognition: Tangent distance and propagation

@article{Simard2000TransformationII,
  title={Transformation invariance in pattern recognition: Tangent distance and propagation},
  author={Patrice Y. Simard and Yann LeCun and John S. Denker and Bernard Victorri},
  journal={Int. J. Imaging Systems and Technology},
  year={2000},
  volume={11},
  pages={181-197}
}
In pattern recognition, statistical modeling, or regression, the amount of data is a critical factor affecting the performance. If the amount of data and computational resources are unlimited, even trivial algorithms will converge to the optimal solution. However, in the practical case, given limited data and other resources, satisfactory performance requires sophisticated methods to regularize the problem by introducing a priori knowledge. Invariance of the output with respect to certain… CONTINUE READING
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