Tracking single-particle dynamics via combined optical and electrical sensing

Abstract

While fluorescent imaging has been extensively used for single-particle tracking, temporal and spatial resolution of the wide-field microscopy technology is not satisfactory for investigating fast-moving features. Here we report a method for probing nanometer-scale motion of an individual particle through a microstructured channel at sub-MHz by combining a… (More)
DOI: 10.1038/srep01855

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