Towards improved survivability in safety-critical systems

Abstract

Performance demand of Critical Real-Time Embedded (CRTE) systems implementing safety-related system features grows at an exponential rate. Only modern semiconductor technologies can satisfy CRTE systems performance needs efficiently. However, those technologies lead to high failure rates, thus lowering survivability of chips to unacceptable levels for CRTE… (More)
DOI: 10.1109/IOLTS.2011.5994536

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Cite this paper

@article{Abella2011TowardsIS, title={Towards improved survivability in safety-critical systems}, author={Jaume Abella and Francisco J. Cazorla and Eduardo Qui{\~n}ones and Arnaud Grasset and Sami Yehia and Philippe Bonnot and Dimitris Gizopoulos and Riccardo Mariani and Guillem Bernat}, journal={2011 IEEE 17th International On-Line Testing Symposium}, year={2011}, pages={240-245} }