Towards cognitive built-in-self-test (BIST) for reconfigurable on-chip applications, and contact-less measurement

Abstract

This paper introduces the concept of cognitive wireless BIST system for reconfigurability of on-chip function blocks, towards contactless measurement and characterization of high frequency integrated systems. Proposed feasibility studies of cognitive BIST cover characterization of chip-to-chip noise interferences as function of wireless coupling-path… (More)

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