Towards Increasing Test Compaction Abilities of SAT-based ATPG through Fault Detection Constraints

@inproceedings{Eggersgl2012TowardsIT,
  title={Towards Increasing Test Compaction Abilities of SAT-based ATPG through Fault Detection Constraints},
  author={Stephan Eggersgl{\"u}\ss and Melanie Diepenbeck and Robert Wille and Rolf Drechsler},
  year={2012}
}
Automatic Test Pattern Generation (ATPG) based on Boolean Satisfiability (SAT) is a robust alternative to classical structural ATPG. Due to the powerful reasoning engines of modern SAT solvers, SAT-based algorithms typically provide a high test coverage because of the ability to reliably classify hardto-detect faults. However, a weak point of SAT-based ATPG is the test compaction ability. In this paper, we propose a new methodology which combines the classical SAT-based ATPG formulation with… CONTINUE READING

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