Toward a Faster Screening of Faulty Digital Chips via Current-Bound Estimation Based on Device Size and Threshold Voltage

Abstract

Observations of peak and average currents are important for designed circuits, as faulty circuits have abnormal peaks and average currents. Using current bounds to detect faulty chips is a comparatively innovative idea, and many advanced schemes without them use it as a component in statistical outlier analysis. However, these previous research works have… (More)

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