Toward Advancing Nano-Object Count Metrology: A Best Practice Framework

  title={Toward Advancing Nano-Object Count Metrology: A Best Practice Framework},
  author={Scott C. Brown and Volodymyr Boyko and Greg Meyers and Matthias Voetz and Wendel Wohlleben},
  booktitle={Environmental health perspectives},
BACKGROUND A movement among international agencies and policy makers to classify industrial materials by their number content of sub-100-nm particles could have broad implications for the development of sustainable nanotechnologies. OBJECTIVES Here we highlight current particle size metrology challenges faced by the chemical industry due to these emerging number percent content thresholds, provide a suggested best-practice framework for nano-object identification, and identify research needs… CONTINUE READING


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