Toward Advancing Nano-Object Count Metrology: A Best Practice Framework

@inproceedings{Brown2013TowardAN,
  title={Toward Advancing Nano-Object Count Metrology: A Best Practice Framework},
  author={Scott C. Brown and Volodymyr Boyko and Greg Meyers and Matthias Voetz and Wendel Wohlleben},
  booktitle={Environmental health perspectives},
  year={2013}
}
BACKGROUND A movement among international agencies and policy makers to classify industrial materials by their number content of sub-100-nm particles could have broad implications for the development of sustainable nanotechnologies. OBJECTIVES Here we highlight current particle size metrology challenges faced by the chemical industry due to these emerging number percent content thresholds, provide a suggested best-practice framework for nano-object identification, and identify research needs… CONTINUE READING

References

Publications referenced by this paper.
Showing 1-10 of 70 references

Theoretical study of the scatter

  • H Masuda, K. Iinoya
  • 2013

2011a, 2011b) is capable of counting particles from < 5 nm to approximately 1 μm in a manner largely independent

  • McEvoy
  • Pease et al. 2009a, 2009b, 2010b; Tsai et al
  • 2012

Similar Papers

Loading similar papers…