Total-dose effects caused by high-energy neutrons and γ-rays in Multiple-Gate FETs

@article{Kilchytska2009TotaldoseEC,
  title={Total-dose effects caused by high-energy neutrons and γ-rays in Multiple-Gate FETs},
  author={Valeriya Kilchytska and J. Alvarado and Nadine Collaert and R. Rooyakers and O. Militaru and Guy Berger and Denis Flandre},
  journal={2009 European Conference on Radiation and Its Effects on Components and Systems},
  year={2009},
  pages={7-13}
}
This work investigates the effects of high-energy neutrons and γ-rays on Multiple-Gate FETs with different geometries (notably gate lengths down to 50 nm). The impact of radiation on device behavior is addressed through the variation of parameters such as threshold voltage, subthreshold slope, transconductance maximum and DIBL. It is shown that degradations caused by γ-rays and high-energy neutrons with similar doses are largely similar. It is revealed that, contrarily to the generally-believed… CONTINUE READING