Total-Dose Worst-Case Test Vectors for Leakage Current Failure Induced in Sequential Circuits of Cell-Based ASICs

@article{AbouAuf2009TotalDoseWT,
  title={Total-Dose Worst-Case Test Vectors for Leakage Current Failure Induced in Sequential Circuits of Cell-Based ASICs},
  author={A. A. Abou-Auf},
  journal={IEEE Transactions on Nuclear Science},
  year={2009},
  volume={56},
  pages={2189-2197}
}
We developed a methodology for identifying worst-case test vectors for leakage current failure induced in sequential circuits of cell-based ASICs induced by total-dose. This methodology is independent on the design tools and the process technology. 
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