## Fault Modeling and Worst-Case Test Vectors of Sequential ASICs Exposed to Total Dose

- Ahmed A. Abou-Auf, Mostafa M. Abdel-Aziz, Hamzah A. Abdel-Aziz, Amr G. Wassal
- IEEE Transactions on Nuclear Science
- 2012

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@article{AbouAuf2009TotalDoseWT, title={Total-Dose Worst-Case Test Vectors for Leakage Current Failure Induced in Sequential Circuits of Cell-Based ASICs}, author={A. A. Abou-Auf}, journal={IEEE Transactions on Nuclear Science}, year={2009}, volume={56}, pages={2189-2197} }

- Published 2009 in IEEE Transactions on Nuclear Science

We developed a methodology for identifying worst-case test vectors for leakage current failure induced in sequential circuits of cell-based ASICs induced by total-dose. This methodology is independent on the design tools and the process technology.

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