Topographic profiling and refractive-index analysis by use of differential interference contrast with bright-field intensity and atomic force imaging.

A methodology is described for phase restoration of an object function from differential interference contrast (DIC) images. The methodology involves collecting a set of DIC images in the same plane with different bias retardation between the two illuminating light components produced by a Wollaston prism. These images, together with one conventional bright… CONTINUE READING