Topographic characterization of unworn contact lenses assessed by atomic force microscopy and wavelet transform.

Abstract

This paper analyses the three-dimensional (3-D) surface morphology of optic surface of unworn contact lenses (CLs) using atomic force microscopy (AFM) and wavelet transform. Refractive powers of all lens samples were 2.50 diopters. Topographic images were acquired in contact mode in air-conditioned medium (35% RH, 23°C). Topographic measurements were taken… (More)
DOI: 10.1002/jemt.22580

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