Tools for the characterization of bipolar CML testability

  title={Tools for the characterization of bipolar CML testability},
  author={Ginette Mont{\'e} and Bernard Antaki and Serge Patenaude and Yvon Savaria and Claude Thibeault and Pieter M. Trouborst},
  journal={Proceedings 19th IEEE VLSI Test Symposium. VTS 2001},
A methodology to characterize thoroughly the defective behavior of CML bipolar gates has been developed. This methodology produced data suitable to guide design for testability in CML circuits. Inductive Fault Analysis (IFA) is first applied to library cell layouts to characterize their sensitivity to realistic defects. The data is then processed by an automatic simulation program that can, according to a list of criteria, classify the defective behavior of all cells. This complete analysis… CONTINUE READING


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