Tools & toys: Hacking the Nokia N800

@article{Wallich2008ToolsT,
  title={Tools \& toys: Hacking the Nokia N800},
  author={P. Wallich},
  journal={IEEE Spectrum},
  year={2008},
  volume={45},
  pages={25-25}
}
1 Citations
On Wires Holding a Handful of Electrons
TLDR
A classical particle-like probabilistic approach is used to enhance on the accuracy of wires’ length-dependent probabilities of failure due to the discreetness of charge, as ignoring some of the intrinsic noises leads to “lower bound”-like wire reliability estimates. Expand