Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.

@article{Winter2009TomographyOI,
  title={Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.},
  author={D. A. Matthijs de Winter and Chris T W M Schneijdenberg and Misja{\"e}l N Lebbink and Ben Lich and Arie J. Verkleij and Martyn R. Drury and Bruno Martin Humbel},
  journal={Journal of microscopy},
  year={2009},
  volume={233 3},
  pages={372-83}
}
Tomography in a focused ion beam (FIB) scanning electron microscope (SEM) is a powerful method for the characterization of three-dimensional micro- and nanostructures. Although this technique can be routinely applied to conducting materials, FIB-SEM tomography of many insulators, including biological, geological and ceramic samples, is often more difficult because of charging effects that disturb the serial sectioning using the ion beam or the imaging using the electron beam. Here, we show that… CONTINUE READING
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