ToF-SIMS analyses of polystyrene and dibenzanthracene: evidence for fragmentation and metastable decay processes in molecular secondary ion emission

  • B. G. Segda
  • Published 2002

Abstract

To understand the sputtering processes in unsaturated polymers, dibenzanthracene and polystyrene samples were bombarded by 15 keV, Ga + ions and the secondary ions were massand energy-analyzed by means of a time-of-flight spectrometer. The influence of various phenomena, which may play an important role in the secondary ion emission from polystyrene… (More)

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Cite this paper

@inproceedings{Segda2002ToFSIMSAO, title={ToF-SIMS analyses of polystyrene and dibenzanthracene: evidence for fragmentation and metastable decay processes in molecular secondary ion emission}, author={B. G. Segda}, year={2002} }