Tip convolution on HOPG surfaces measured in AM-AFM and interpreted using a combined experimental and simulation approach.

Abstract

Amplitude modulated atomic force microscopy (AM-AFM) was used to examine the influence of the size of the AFM tip apex on the measured surface topography of single highly oriented pyrolytic graphite (HOPG) atomic steps. Experimental measurements were complemented by molecular dynamics simulations of AM-AFM and the results from both were evaluated by… (More)

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