Timing Evaluation Tests for Scan Enable Signals with Application to TDF Testing

@article{Zou2014TimingET,
  title={Timing Evaluation Tests for Scan Enable Signals with Application to TDF Testing},
  author={Jie Zou and Chao Han and Adit D. Singh},
  journal={2014 IEEE 23rd Asian Test Symposium},
  year={2014},
  pages={281-286}
}
Scan based transition delay fault (TDF) tests are generally applied in the launch-on-capture (LOC) mode because the scan enable control signal broadcast to all flip-flops on the die is expensive to implement as a fast switching signal needed to support at-speed launch-on-shift (LOS) tests. However, there is mounting evidence that even when applied at much slower speeds, LOS tests often detect a significant fraction of the timing defects, including many unique failures that are missed by LOC… CONTINUE READING

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