Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST

  title={Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan BIST},
  author={Kwang-Ting Cheng and Chih-Jen Lin},
Highly Cited
This paper has 119 citations. REVIEW CITATIONS

From This Paper

Topics from this paper.


Publications citing this paper.
Showing 1-10 of 65 extracted citations

Impact of test point insertion on silicon area and timing during layout

Proceedings Design, Automation and Test in Europe Conference and Exhibition • 2004
View 12 Excerpts
Highly Influenced

Improving test effectiveness of scan-based BIST by scan chain partitioning

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems • 2005
View 8 Excerpts
Highly Influenced

On calculating efficient LFSR seeds for built-in self test

European Test Workshop 1999 (Cat. No.PR00390) • 1999
View 11 Excerpts
Highly Influenced

Embedded Deterministic Test Points

IEEE Transactions on Very Large Scale Integration (VLSI) Systems • 2017
View 1 Excerpt

Minimal area test points for deterministic patterns

2016 IEEE International Test Conference (ITC) • 2016
View 1 Excerpt

120 Citations

Citations per Year
Semantic Scholar estimates that this publication has 120 citations based on the available data.

See our FAQ for additional information.

Similar Papers

Loading similar papers…