Time-Periodic Avalanche Breakdown at the Edge Termination of Power Devices

Abstract

We show that the "variation of lateral doping" (VLD) edge termination technique (Fig. 1) exhibits a surprisingly high robustness in the avalanche regime. This is the consequence of a self-limiting time-periodic current filamentation mechanism, which prevents the VLD structure from being destroyed, in contrast to stable stationary current filaments staying… (More)

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Cite this paper

@article{Knipper2008TimePeriodicAB, title={Time-Periodic Avalanche Breakdown at the Edge Termination of Power Devices}, author={U. Knipper and G. Wachutka and F. Pfirsch and Thomas Raker and J. Niedermeyr}, journal={2008 20th International Symposium on Power Semiconductor Devices and IC's}, year={2008}, pages={307-310} }