Three-dimensional total internal reflection microscopy.

@article{Carney2001ThreedimensionalTI,
  title={Three-dimensional total internal reflection microscopy.},
  author={P. Scott Carney and John C. Schotland},
  journal={Optics letters},
  year={2001},
  volume={26 14},
  pages={1072-4}
}
We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution. 

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Reconstructed tomographs of the real and imaginary parts of the susceptibility with a prism of refractive index n 4

C. Girard, A. Dereux, Rep
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