Three-dimensional imaging of dislocations in a nanoparticle at atomic resolution

@article{Chen2013ThreedimensionalIO,
  title={Three-dimensional imaging of dislocations in a nanoparticle at atomic resolution},
  author={Chien-Chun Chen and Chun Zhu and Edward. R. White and Chin-Yi Chiu and M. C. Scott and B. C. Regan and Laurence D. Marks and Yu Huang and Jianwei (John) Miao},
  journal={Nature},
  year={2013},
  volume={496},
  pages={74-77}
}
Dislocations and their interactions strongly influence many material properties, ranging from the strength of metals and alloys to the efficiency of light-emitting diodes and laser diodes. Several experimental methods can be used to visualize dislocations. Transmission electron microscopy (TEM) has long been used to image dislocations in materials, and high-resolution electron microscopy can reveal dislocation core structures in high detail, particularly in annular dark-field mode. A TEM image… 
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