Three-dimensional analysis by electron diffraction methods of nanocrystalline materials.

Abstract

To analyze nanocrystalline structures quantitatively in 3D, a novel method is presented based on electron diffraction. It allows determination of the average size and morphology of the coherently scattering domains (CSD) in a straightforward way without the need to prepare multiple sections. The method is applicable to all kinds of bulk nanocrystalline… (More)
DOI: 10.1017/S1431927611011962

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Cite this paper

@article{Gammer2011ThreedimensionalAB, title={Three-dimensional analysis by electron diffraction methods of nanocrystalline materials.}, author={Christoph Gammer and Clemens Mangler and Hans-Peter Karnthaler and Christian Rentenberger}, journal={Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada}, year={2011}, volume={17 6}, pages={866-71} }