Three Generalizations to a Generic Integrated Test Generation Method for Finite State Machines


In a previous paper, we proposed a generic test generation method for deterministic implementations of deterministic finite state machines. The method supports a wide class of testing strategies, multi-criteria optimization and integrated handling of all the usual optimization concerns. The present paper generalizes the method to an even wider class of… (More)
DOI: 10.1093/comjnl/bxn048

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