Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy

Abstract

We present the noble sensing method that can simultaneously measure the physical thickness and the refractive index of a transparent specimen based on full-field optical coherence microscopy. As a sample, a small drop of epoxy was placed on a flat glass plate and high-resolution depth resolved en-face images were taken. With adopting the reference plane… (More)

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@article{Na2009ThicknessAR, title={Thickness and Refractive Index Measurements by Full-Field Optical Coherence Microscopy}, author={Jihoon Na and W. J. Choi and Hye Young Choi and Seon Young Ryu and Eun Seo Choi and Byeong Ha Lee}, journal={IEEE Sensors Journal}, year={2009}, volume={9}, pages={1996-1997} }