Thermionic-emission diffusion model of current conduction in polycrystalline silicon

Abstract

A comprehensive model of current conduction in polycrystalline silicon based on thermionic-emission diffusion theory is developed. On the basis of this model, a more general expression for the effective majority-carrier mobility is derived which reduces to thermionic-emission (TE) theory-based expressions under certain simplifying assumptions and also helps… (More)

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