Thermally induced interface degradation in (111) Si/SiO2 traced by electron spin resonance.

@article{Stesmans1996ThermallyII,
  title={Thermally induced interface degradation in (111) Si/SiO2 traced by electron spin resonance.},
  author={Stesmans and Afanas'ev},
  journal={Physical review. B, Condensed matter},
  year={1996},
  volume={54 16},
  pages={R11129-R11132}
}

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