Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping

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@article{Bychikhin2007ThermalAO, title={Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping}, author={Sergey Bychikhin and T. Swietlik and Tadeusz Suski and S. Porowski and Piotr Perlin and Dionyz Pogany}, journal={Microelectronics Reliability}, year={2007}, volume={47}, pages={1649-1652} }