The study of TE process based on the improved PCA method

@article{Yu2008TheSO,
  title={The study of TE process based on the improved PCA method},
  author={Yang Yu and Yawei Zhao and Qing Yang and D. Wang and Liang Chen},
  journal={2008 3rd IEEE Conference on Industrial Electronics and Applications},
  year={2008},
  pages={1215-1217}
}
Using principal component analysis and wavelet analysis technology, an improved PCA method is proposed in order to detect industrial faults. The definition of the differences between principal component subspaces is introduced. The program structure of the system is set up based on the improved method. The simulation result shows that the improved PCA has better performance; and gives an efficient illustration for the related problems in the fault detection field.