• Corpus ID: 248811023

The restricted minimum density power divergence estimator for non-destructive one-shot device testing the under step-stress model with exponential lifetimes

@inproceedings{Balakrishnan2022TheRM,
  title={The restricted minimum density power divergence estimator for non-destructive one-shot device testing the under step-stress model with exponential lifetimes},
  author={Narayanaswamy Balakrishnan and Mar{\'i}a Jaenada and Leandro Pardo},
  year={2022}
}
One-shot devices data represent an extreme case of interval censoring. Some kind of one-shot units do not get destroyed when tested, and so, survival units can continue within the test providing extra information about their lifetime. Moreover, one-shot devices may last for long times under normal operating conditions, and so accelerated life tests (ALTs) may be used for inference. ALTs relate the lifetime distribution of an unit with the stress level at which it is tested via log-linear… 

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