The reliability of semiconductor RAM memories with on-chip error-correction coding

@article{Goodman1991TheRO,
  title={The reliability of semiconductor RAM memories with on-chip error-correction coding},
  author={Rodney M. Goodman and Masahiro Sayano},
  journal={IEEE Trans. Information Theory},
  year={1991},
  volume={37},
  pages={884-896}
}
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