The maximum a posteriori probability rule for atom column detection from HAADF STEM images.

@article{Fatermans2019TheMA,
  title={The maximum a posteriori probability rule for atom column detection from HAADF STEM images.},
  author={J. Fatermans and S. van Aert and A. J. den Dekker},
  journal={Ultramicroscopy},
  year={2019},
  volume={201},
  pages={
          81-91
        }
}
  • J. Fatermans, S. van Aert, A. J. den Dekker
  • Published 2019
  • Computer Science, Medicine, Physics
  • Ultramicroscopy
    • Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images. The method combines statistical parameter estimation and model-order selection using a Bayesian framework and has been shown to be especially useful for the analysis of the structure of beam-sensitive nanomaterials. In… CONTINUE READING
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    References

    SHOWING 1-10 OF 66 REFERENCES
    Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy.
    • 145
    • PDF
    Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy.
    • 64
    • PDF
    Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM images.
    • 90
    Estimation of unknown structure parameters from high-resolution (S)TEM images: what are the limits?
    • 35
    • PDF
    Procedure to count atoms with trustworthy single-atom sensitivity
    • 89
    • PDF
    StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images.
    • 63
    • PDF
    Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images.
    • 14
    • PDF
    Model-based electron microscopy : from images toward precise numbers for unknown structure parameters
    • 10
    Incoherent imaging of zone axis crystals with ADF STEM
    • 175
    Maximum likelihood estimation of structure parameters from high resolution electron microscopy images. Part II: a practical example.
    • 54
    • PDF