The maximum a posteriori probability rule for atom column detection from HAADF STEM images.

@article{Fatermans2019TheMA,
  title={The maximum a posteriori probability rule for atom column detection from HAADF STEM images.},
  author={J. Fatermans and S. van Aert and A. J. den Dekker},
  journal={Ultramicroscopy},
  year={2019},
  volume={201},
  pages={
          81-91
        }
}
  • J. Fatermans, S. van Aert, A. J. den Dekker
  • Published 2019
  • Computer Science, Medicine, Physics
  • Ultramicroscopy
  • Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images. The method combines statistical parameter estimation and model-order selection using a Bayesian framework and has been shown to be especially useful for the analysis of the structure of beam-sensitive nanomaterials. In… CONTINUE READING
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