The maximum a posteriori probability rule for atom column detection from HAADF STEM images.

@article{Fatermans2019TheMA,
  title={The maximum a posteriori probability rule for atom column detection from HAADF STEM images.},
  author={J. Fatermans and Sandra Van Aert and Arnold J. den Dekker},
  journal={Ultramicroscopy},
  year={2019},
  volume={201},
  pages={
          81-91
        }
}
Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images. The method combines statistical parameter estimation and model-order selection using a Bayesian framework and has been shown to be especially useful for the analysis of the structure of beam-sensitive nanomaterials. In… Expand
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Atom column detection from simultaneously acquired ABF and ADF STEM images.
TLDR
Using simulations as well as experimental data, it is shown that the proposed methodology can be successfully used to detect light elements in the presence of heavy elements. Expand
Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations.
TLDR
The method is shown to be promising for a reliable quantitative analysis of dynamic processes such as surface diffusion, adatom dynamics, beam effects, or in situ experiments and explored the possibilities for applying the method to time series recorded under variable environmental conditions. Expand
Tracking the picoscale spatial motion of atomic columns during dynamic structural change.
TLDR
A two-dimensional Gaussian fitting algorithm to track the position and intensities of atomic columns in temporally resolved BF TEM image series and is tested on experimental image series of Ce atomic columns near the surface of a ceria (CeO2) nanoparticle with electron beam doses of ~125-5000 e-Å-2 per frame. Expand
Advances and Applications of Atomic-Resolution Scanning Transmission Electron Microscopy
  • J. Liu
  • Medicine
  • Microscopy and Microanalysis
  • 2021
TLDR
This review focuses on advances of STEM imaging from the invention of the field-emission electron gun to the realization of aberration-corrected and monochromated atomic-resolution STEM and its broad applications. Expand
Contrast transfer and noise considerations in focused-probe electron ptychography.
TLDR
The contrast transfer of focused-probe, non-iterative electron ptychography using the single-side-band (SSB) method is demonstrated experimentally and normalisation of the transfer function with respect to the noise level shows that the transfer window is increased while avoiding noise amplification. Expand
Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt.
TLDR
It is demonstrated how reliable atom-counting can still be achieved in the presence of small sample tilt, and no significant quantitative improvement in the estimated structure parameters is achieved by the elliptical model as compared to the symmetrical model. Expand
Atom column detection
Development of a Practicable Digital Pulse Read-Out for Dark-Field STEM
TLDR
This article presents an alternative approach to capture dark-field STEM images by pulse-counting individual electrons as they are scattered to the annular dark- field (ADF) detector, which are immune from analog artifacts of streaking or afterglow and allow clean, high-SNR images to be obtained even at low beam-currents. Expand
General conclusions and future perspectives
Image-quality evaluation and model selection with maximum a posteriori probability
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