The maximum a posteriori probability rule for atom column detection from HAADF STEM images.
@article{Fatermans2019TheMA, title={The maximum a posteriori probability rule for atom column detection from HAADF STEM images.}, author={J. Fatermans and S. van Aert and A. J. den Dekker}, journal={Ultramicroscopy}, year={2019}, volume={201}, pages={ 81-91 } }
Recently, the maximum a posteriori (MAP) probability rule has been proposed as an objective and quantitative method to detect atom columns and even single atoms from high-resolution high-angle annular dark-field (HAADF) scanning transmission electron microscopy (STEM) images. The method combines statistical parameter estimation and model-order selection using a Bayesian framework and has been shown to be especially useful for the analysis of the structure of beam-sensitive nanomaterials. In… CONTINUE READING
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