The impact of recovery on BTI reliability assessments

  title={The impact of recovery on BTI reliability assessments},
  author={Hans Reisinger and Tibor Grasser and Karl Hofmann and Wolfgang Gustin and Christian Schlunder},
  journal={2010 IEEE International Integrated Reliability Workshop Final Report},
BTI is shown to be the most important device degradation mechanism for combinational logic. Significant benefits regarding lifetime predictions and the total effort in measurement time can be expected from measurements minimizing recovery by a short measuring delay or/and assessments being done with AC stress for applications ensuring AC operation only.