The extremely low frequency electrical properties of plant stems.

  title={The extremely low frequency electrical properties of plant stems.},
  author={Francis X. Hart},
  volume={6 3},
The electrical properties (variation of capacitance and conductance with frequency) of a plant stem can be conveniently measured in vivo by time domain dielectric spectroscopy. In this technique a voltage step is applied to a stem. The resulting polarization current is sampled by a microprocessor and Fourier-transformed to yield these properties. Spectra were obtained for seven electrode separations along a Poinsettia stem. The inverse capacitance and conductance were plotted vs separation for… CONTINUE READING

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