The extremely low frequency electrical properties of plant stems.

@article{Hart1985TheEL,
  title={The extremely low frequency electrical properties of plant stems.},
  author={Francis X. Hart},
  journal={Bioelectromagnetics},
  year={1985},
  volume={6 3},
  pages={243-56}
}
The electrical properties (variation of capacitance and conductance with frequency) of a plant stem can be conveniently measured in vivo by time domain dielectric spectroscopy. In this technique a voltage step is applied to a stem. The resulting polarization current is sampled by a microprocessor and Fourier-transformed to yield these properties. Spectra were obtained for seven electrode separations along a Poinsettia stem. The inverse capacitance and conductance were plotted vs separation for… CONTINUE READING

From This Paper

Figures, tables, results, connections, and topics extracted from this paper.
0 Extracted Citations
0 Extracted References
Similar Papers

Similar Papers

Loading similar papers…