The dynamic T 2 chart for monitoring feedback-controlled processes

@inproceedings{Tsung2002TheDT,
  title={The dynamic T 2 chart for monitoring feedback-controlled processes},
  author={Fugee Tsung and Daniel W. Apley},
  year={2002}
}
As manufacturing quality has become a decisive factor in global market competition, statistical quality techniques such as Statistical Process Control (SPC) are widely used in industry. With advances in information, sensing, and data collection technology, large volumes of data are routinely available in processes employing Automatic Process Control (APC) and Engineering Process Control (EPC). Although there is a growing need for SPC monitoring in these feedback-controlled environments, an… CONTINUE READING
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