The distinctiveness, detectability, and robustness of local image features

  title={The distinctiveness, detectability, and robustness of local image features},
  author={Gustavo Carneiro and Allan D. Jepson},
  journal={2005 IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR'05)},
  pages={296-301 vol. 2}
We introduce a new method that characterizes typical local image features (e.g., SIFT, phase feature) in terms of their distinctiveness, detectability, and robustness to image deformations. This is useful for the task of classifying local image features in terms of those three properties. The importance of this classification process for a recognition system using local features is as follows: a) reduce the recognition time due to a smaller number of features present in the test image and in… CONTINUE READING
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