The Weighted Random Test-Pattern Generator

@article{Schnurmann1975TheWR,
  title={The Weighted Random Test-Pattern Generator},
  author={H. Daniel Schnurmann and Eric Lindbloom and Robert G. Carpenter},
  journal={IEEE Transactions on Computers},
  year={1975},
  volume={C-24},
  pages={695-700}
}
A heuristic method for generating large-scale integration (LSI) test patterns is described. In particular, this paper presents a technique for generating statistically random sequences to test complex logic circuits. The algorithms used to obtain a set of tests by means of weighted logic signal variations are included. Several techniques for assigning these weights and for varying them are discussed on the basis of the primary algorithm. Also described is a means of obtaining a minimal number… CONTINUE READING
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Statistical logic test system having a weighted random test ttern generator

  • E. Lindbloom, T. M. McMahon
  • 1971

An algorithm and a program for generation of test patterns for sequential circuits

  • G. R. Putzolu, J. P. Roth
  • Proc. 8rd Hawaii Int. Conf. Syst. Sci., 1970, pp…
  • 1970

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