The Study of Transient Faults Propagation in Multithread Applications

Abstract

Whereas contemporary Error Correcting Codes (ECC) designs occupy a significant fraction of total die area in chipmultiprocessors (CMPs), approaches to deal with the vulnerability increase of CMP architecture against Single Event Upsets (SEUs) and Multi-Bit Upsets (MBUs) are sought. In this paper, we focus on reliability assessment of multithreaded… (More)

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Cite this paper

@article{Khoshavi2016TheSO, title={The Study of Transient Faults Propagation in Multithread Applications}, author={Navid Khoshavi and Armin Samiei}, journal={CoRR}, year={2016}, volume={abs/1607.08523} }