The Reliability of Single-Error Protected Computer Memories

  title={The Reliability of Single-Error Protected Computer Memories},
  author={Mario Blaum and Rodney M. Goodman and Robert J. McEliece},
  journal={IEEE Trans. Computers},
+ dl (@be + bcd + bede + ad + ace). Noting that the desired function is to be realized on node 1 of the circuit, the C F of the specification can be obtained [2], [3] as @*= d l f + d l f + DON'T CARE terms = dl (66 + &+ 6@+ 6Cd) + dl (ad+ be+ ace + bcd) + abcde. From [2] and [3],_a circuit realizes its specification iff +* < +S. In other words, @*.a, = 0. That the latter relation is satisfied can be easily verified by inspection, since 4S can be expressed as &s= [ d 1 (6 6 + d e ? + ~ ~ f… CONTINUE READING
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