The Origin of the Odd-Even Effect in the Tunneling Rates across EGaIn Junctions with Self-Assembled Monolayers (SAMs) of n-Alkanethiolates.

@article{Jiang2015TheOO,
  title={The Origin of the Odd-Even Effect in the Tunneling Rates across EGaIn Junctions with Self-Assembled Monolayers (SAMs) of n-Alkanethiolates.},
  author={Li Chang Jiang and C. S. Suchand Sangeeth and Christian A Nijhuis},
  journal={Journal of the American Chemical Society},
  year={2015},
  volume={137 33},
  pages={10659-67}
}
Odd-even effects in molecular junctions with self-assembled monolayers (SAMs) of n-alkanethiolates have been rarely observed. It is challenging to pinpoint the origin of odd-even effects and address the following question: are the odd-even effects an interface effect, caused by the intrinsic properties of the SAMs, or a combination of both? This paper describes the odd-even effects in SAM-based tunnel junctions of the form Ag(A-TS)-SC(n)//GaO(x)/EGaIn junctions with a large range of molecular… CONTINUE READING

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