The Impact of NBTI on the Performance of Combinational and Sequential Circuits

@article{Wang2007TheIO,
  title={The Impact of NBTI on the Performance of Combinational and Sequential Circuits},
  author={Wenping Wang and Shengqi Yang and Sarvesh Bhardwaj and Rakesh Vattikonda and Sarma B. K. Vrudhula and Frank Liu and Yu Cao},
  journal={2007 44th ACM/IEEE Design Automation Conference},
  year={2007},
  pages={364-369}
}
Negative-bias-temperature-instability (NBTI) has become the primary limiting factor of circuit lifetime. In this work, we develop a general framework for analyzing the impact of NBTI on the performance of a circuit, based on various circuit parameters such as the supply voltage, temperature, and node switching activity of the signals etc. We propose an efficient method to predict the degradation of circuit performance based on circuit topology and the switching activity of the signals over long… Expand
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