The Impact of NBTI on the Performance of Combinational and Sequential Circuits

  title={The Impact of NBTI on the Performance of Combinational and Sequential Circuits},
  author={Wenping Wang and Shengqi Yang and Sarvesh Bhardwaj and Rakesh Vattikonda and Sarma B. K. Vrudhula and Frank Liu and Yu Cao},
  journal={2007 44th ACM/IEEE Design Automation Conference},
Negative-bias-temperature-instability (NBTI) has become the primary limiting factor of circuit lifetime. In this work, we develop a general framework for analyzing the impact of NBTI on the performance of a circuit, based on various circuit parameters such as the supply voltage, temperature, and node switching activity of the signals etc. We propose an efficient method to predict the degradation of circuit performance based on circuit topology and the switching activity of the signals over long… 

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  • 2014
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Negative bias temperature instability (NBTI) in PMOS transistors has become a significant reliability concern in present day digital circuit design. With continued scaling, the effect of NBTI has

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  • 2003
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NBTI reliability analysis for a 90 nm CMOS technology

  • H. PuchnerL. Hinh
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    Proceedings of the 30th European Solid-State Circuits Conference (IEEE Cat. No.04EX850)
  • 2004
We present a comprehensive empirical study to investigate the impact of negative bias temperature instability (NBTI) on device performance and reliability. The NBTI lifetime is calculated for

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