The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis

@article{Wang2010TheIO,
  title={The Impact of NBTI Effect on Combinational Circuit: Modeling, Simulation, and Analysis},
  author={Wenping Wang and Shengqi Yang and S. Bhardwaj and S. Vrudhula and Frank Liu and Yu Cao},
  journal={IEEE Transactions on Very Large Scale Integration (VLSI) Systems},
  year={2010},
  volume={18},
  pages={173-183}
}
  • Wenping Wang, Shengqi Yang, +3 authors Yu Cao
  • Published 2010
  • Computer Science, Engineering
  • IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Negative-bias-temperature instability (NBTI) has become the primary limiting factor of circuit life time. In this paper, we develop a hierarchical framework for analyzing the impact of NBTI on the performance of logic circuits under various operation conditions, such as the supply voltage, temperature, and node switching activity. Given a circuit topology and input switching activity, we propose an efficient method to predict the degradation of circuit speed over a long period of time. The… Expand
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