The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems

@article{Hunger2010TheIO,
  title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems},
  author={Marc Hunger and Sybille Hellebrand},
  journal={2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems},
  year={2010},
  pages={101-108}
}
Hardware redundancy provides an effective approach to compensate errors online. In addition to that, built-in redundancy can also compensate manufacturing defects and help to increase yield. If both yield improvement and online fault tolerance are addressed, classical models for yield and product quality are no longer sufficient, since a defect-free chip comprises the whole potential of redundancy whereas functional chips with compensated defects may have a strongly reduced fault-tolerance. In… CONTINUE READING

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