The Impact of MBUs on the Reliability of Rollback Recovery Circuits

@article{Huang2009TheIO,
  title={The Impact of MBUs on the Reliability of Rollback Recovery Circuits},
  author={Zhengfeng Huang and Huaguo Liang},
  journal={2009 IEEE Circuits and Systems International Conference on Testing and Diagnosis},
  year={2009},
  pages={1-4}
}
With technology scaling, radiation induced soft errors have become a serious issue for both aero and terrestrial applications. To mitigate soft errors induced by radiation, rollback recovery is one of the most commonly used techniques. In this paper, a model that deals with Multiple Bit Upsets (MBUs) is proposed to study the impact of MBUs on the reliability of rollback recovery circuits, by calculating the soft error rate of 180nm devices. The simulations at ground level and at high latitude… CONTINUE READING
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