The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

@article{King2010TheIO,
  title={The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs},
  author={M. P. King and R. A. Reed and R. A. Weller and M. H. Mendenhall and R. D. Schrimpf and M. L. Alles and Elizabeth C. Auden and S. E. Armstrong and M. Asai},
  journal={IEEE Transactions on Nuclear Science},
  year={2010},
  volume={57},
  pages={3169-3175}
}
Monte-Carlo radiation transport simulations are used to quantify energy deposition from δ -rays in sensitive volumes representative of future SRAM technologies. The results show that single and multiple δ-ray events are capable of depositing sufficient energy to cause SEUs in nonadjacent SRAM cells separated by many micrometers. These results indicate the… CONTINUE READING

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