The Impact of Aging Effects and Manufacturing Variation on SRAM Soft-Error Rate

@article{Cannon2008TheIO,
  title={The Impact of Aging Effects and Manufacturing Variation on SRAM Soft-Error Rate},
  author={E. H. Cannon and A. J. Kleinosowski and Rouwaida Kanj and D. Reinhardt and Roopali V. Joshi},
  journal={IEEE Transactions on Device and Materials Reliability},
  year={2008},
  volume={8},
  pages={145-152}
}
This paper describes modeling and hardware results of how the soft-error rate (SER) of a 65-nm silicon-on-insulator SRAM memory cell changes over time, as semiconductor aging effects shift the SRAM cell behavior. This paper also describes how the SER changes in the presence of systematic and random manufacturing variation. 

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