The Force Needed to Move an Atom on a Surface

@article{Ternes2008TheFN,
  title={The Force Needed to Move an Atom on a Surface},
  author={Markus Ternes and Christopher P. Lutz and Cyrus F Hirjibehedin and Franz J. Giessibl and Andreas J. Heinrich},
  journal={Science},
  year={2008},
  volume={319},
  pages={1066 - 1069}
}
Manipulation of individual atoms and molecules by scanning probe microscopy offers the ability of controlled assembly at the single-atom scale. However, the driving forces behind atomic manipulation have not yet been measured. We used an atomic force microscope to measure the vertical and lateral forces exerted on individual adsorbed atoms or molecules by the probe tip. We found that the force that it takes to move an atom depends strongly on the adsorbate and the surface. Our results indicate… Expand
Determination of chemical specific atomic interaction with scanning tunneling microscope
We present an experimental technique to comparatively determine the shape of tip-atom interaction potential and interaction strength of individual atoms on a surface using a scanning tunnellingExpand
Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy
TLDR
This work reports the assembling of complex atomic patterns at room temperature by the vertical interchange of atoms between the tip apex of an atomic force microscope and a semiconductor surface using first-principles calculations. Expand
Atomic force microscopy as a tool for atom manipulation.
TLDR
Progress in the manipulation of atoms and molecules with the atomic force microscope is reviewed, and the new opportunities presented by this technique are discussed. Expand
The mechanisms underlying the enhanced resolution of atomic force microscopy with functionalized tips
By functionalizing the tip of an atomic force microscope (AFM) with a molecule or an atom that significantly contributes to the tip–sample interaction, the resolution can be dramatically enhanced.Expand
Atom Manipulation on Semiconductor Surfaces
Since the sophisticated atom manipulation experiment reported by Eigler, single atom manipulation and assembly by scanning tunneling microscopy (STM) has attracted much attention because of theExpand
Atom Manipulation Using Atomic Force Microscopy at Room Temperature
Atomic force microscopy (AFM) has demonstrated its capabilities as a nanotechnology tool. These capabilities include imaging/characterizing individual atoms on various surfaces and manipulating atomsExpand
One-Dimensional Lateral Force Anisotropy at the Atomic Scale in Sliding Single Molecules on a Surface.
TLDR
The origin of the lateral force anisotropy observed here is traced to the one-dimensional shape of the molecule, which is further confirmed by molecular dynamics simulations and it is demonstrated that scanning tunneling microscopy can be used to determine the comparative lateral force qualitatively. Expand
Long Jumps of an Organic Molecule Induced by Atomic Force Microscopy Manipulation
Non-contact atomic force microscopy at cryogenic temperatures is used for the controlled lateral manipulation of individual 3,4,9,10-perylene-tetracarboxylicacid-dianhydride (PTCDA) molecules on theExpand
Vibrations of a molecule in an external force field
TLDR
Atomic force microscopy with inelastic tunneling spectroscopy is combined to measure the influence of the forces exerted by the tip on the lateral vibrational modes of a carbon monoxide molecule on a copper surface and shows that the bonds within the molecule and with the surface are weakened by the proximity of the tip. Expand
Atomically resolved force microscopy
Atomic force microscopy (AFM) with atomic resolution has opened up a new “atom world” based on the chemical nanoscale force. In the noncontact regime where a weak attractive chemical force appears,Expand
...
1
2
3
4
5
...

References

SHOWING 1-10 OF 36 REFERENCES
Lateral manipulation of single atoms at semiconductor surfaces using atomic force microscopy
Experimental results on the lateral manipulation of single atoms at semiconductor surfaces using non-contact atomic force microscopy (NC-AFM) are presented. These experiments prove that depositedExpand
Force measurement with a scanning tunneling microscope
The scanning tunneling microscope STM has proven its unique abilities in imaging surfaces up to atomic resolution. Soon after its invention by Binnig and Rohrer it was realized that, due to its closeExpand
BASIC STEPS OF LATERAL MANIPULATION OF SINGLE ATOMS AND DIATOMIC CLUSTERS WITH A SCANNING TUNNELING MICROSCOPE TIP
Detailed tip height measurements during manipulation of single atoms, molecules, and dimers on a Cu(211) surface reveal different manipulation modes depending on tunneling parameters. Both attractiveExpand
Positioning single atoms with a scanning tunnelling microscope
SINCE its invention in the early 1980s by Binnig and Rohrer1,2, the scanning tunnelling microscope (STM) has provided images of surfaces and adsorbed atoms and molecules with unprecedentedExpand
Atom inlays performed at room temperature using atomic force microscopy
TLDR
It is demonstrated, for the first time, that it is possible to perform well-controlled lateral manipulations of single atoms using near-contact atomic force microscopy even at room temperature. Expand
Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.
TLDR
A distinct substructure is reported on in the images of individual adatoms on silicon (111)-(7x7), two crescents with a spherical envelope, interpreted as images of two atomic orbitals of the front atom of the tip. Expand
Controlling the Dynamics of a Single Atom in Lateral Atom Manipulation
TLDR
The dynamics of a single cobalt (Co) atom during lateral manipulation on a copper (111) surface in a low-temperature scanning tunneling microscope showed a strong dependence on tunneling voltage, indicative of vibrational heating by inelastic electron scattering. Expand
Noncontact Atomic Force Microscopy: Volume 3
Since the original publication of Noncontact Atomic Force Microscopy in 2002, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. This second treatment deals with theExpand
Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy.
TLDR
First-principles calculations reveal that the presence of the tip induces structural relaxations that weaken the adatom surface bonds and manifests in a considerable local reduction of the natural diffusion barriers to adjacent adsorption positions. Expand
Measurement of three-dimensional force fields with atomic resolution using dynamic force spectroscopy
Using dynamic force microscopy and spectroscopy in an ultrahigh vacuum (“noncontact atomic force microscopy”) at low temperatures, we measured three-dimensional force fields with atomic resolution.Expand
...
1
2
3
4
...