The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the LM 124 Operational Amplifier

@inproceedings{Buchner2008TheEO,
  title={The Effects of Low Dose-Rate Ionizing Radiation on the Shapes of Transients in the LM 124 Operational Amplifier},
  author={S. Buchner and Dale Mcmorrow and Nicholas Roche and Laurent Dusseau and R. L. Pease},
  year={2008}
}
Shapes of single event transients (SETs) in a linear bipolar circuit (LM124) change with exposure to total ionizing dose (TID) radiation. SETs shape changes are a direct consequence of TID-induced degradation of bipolar transistor gain. A reduction in transistor gain causes a reduction in the drive current of the current sources in the circuit, and it is the lower drive current that most affects the shapes of large amplitude SETs. 

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