The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs

@inproceedings{Espinosa2013TheCO,
  title={The Challenge of Detection and Diagnosis of Fugacious Hardware Faults in VLSI Designs},
  author={Jaime Espinosa and David de Andr{\'e}s and Juan-Carlos Ruiz-Garcia and Pedro J. Gil},
  booktitle={EWDC},
  year={2013}
}
Current integration scales are increasing the number and types of faults that embedded systems must face. Traditional approaches focus on dealing with those transient and permanent faults that impact the state or output of systems, whereas little research has targeted those faults being logically, electrically or temporally masked -which we have named… CONTINUE READING