Testing of a SoC with a Pre-tested and Pre-verified Silicon

@inproceedings{Ghosh2016TestingOA,
  title={Testing of a SoC with a Pre-tested and Pre-verified Silicon},
  author={Prokash Ghosh},
  year={2016}
}
Due to increase in SoC complexity, the cost of production testing on automated testing equipment (ATE) is increasing, which directly impact the gross margin and viability of any SoC. These pushes SoC maker to look for an alternative method of testing. This paper proposes an alternate scheme for production testing whereby major part (I/O AC specification testing, functional testing, loopback of Serializer/De-serializer (SERDES) testing, frequency testing, Built-In-Self-Test(BIST) etc) of the SoC… CONTINUE READING