Testing linear and non-linear analog circuits using moment generating functions

@article{Sindia2011TestingLA,
  title={Testing linear and non-linear analog circuits using moment generating functions},
  author={Suraj Sindia and V. D. Agrawal and Virendra Singh},
  journal={2011 12th Latin American Test Workshop (LATW)},
  year={2011},
  pages={1-6}
}
Circuit under test (CUT) is treated as a transformation on the probability density function of its input excitation, which is, a continuous random variable (RV) of gaussian probability distribution. Probability moments of the output, which is now the transformed RV, is used as a metric for testing catastrophic and parametric faults in circuit components that make up the CUT. Use of probability moments as circuit test metric with white noise excitation as input addresses three important problems… CONTINUE READING
6 Citations
31 References
Similar Papers

References

Publications referenced by this paper.
Showing 1-10 of 31 references

Similar Papers

Loading similar papers…